ATOMIC NUMBER INTENSITY PROFILES IN SCANNING ELECTRON-MICROSCOPE - GOLD AND ALUMINUM

被引：4

作者：

ROBINSON, VNE

GEORGE, EP

机构：

[1] UNIV NEW S WALES,FAC APPL SCI,KENSINGTON 2033,NEW S WALES,AUSTRALIA

[2] UNIV NEW S WALES,SCH PHYS,KENSINGTON 2033,NEW S WALES,AUSTRALIA

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1976年 / 107卷 / MAY期

关键词：

D O I：

10.1111/j.1365-2818.1976.tb02426.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：85 / 91

页数：7

共 50 条

[31] SCANNING ELECTRON MICROSCOPE-BASED METROLOGICAL ELECTRON-MICROSCOPE SYSTEM AND NEW PROTOTYPE SCANNING ELECTRON-MICROSCOPE MAGNIFICATION STANDARD
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[32] INTEGRATED NANOFABRICATION WITH THE SCANNING ELECTRON-MICROSCOPE AND SCANNING TUNNELING MICROSCOPE
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[39] FORENSIC APPLICATIONS OF SCANNING ELECTRON-MICROSCOPE
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[40] REPLICA TECHNIQUES FOR SCANNING ELECTRON-MICROSCOPE
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