FAULT TOLERANCE IN VLSI CIRCUITS

被引：41
|
作者：
KOREN, I
SINGH, AD
机构：
[1] Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst
来源：
COMPUTER | 1990年 / 23卷 / 07期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1109/2.56854
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
[No abstract available]
引用
收藏
页码：73 / 83
页数：11
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