ATOMIC-FORCE MICROSCOPY OF C60 TETHERED TO A SELF-ASSEMBLED MONOLAYER

被引:82
|
作者
TSUKRUK, VV [1 ]
LANDER, LM [1 ]
BRITTAIN, WJ [1 ]
机构
[1] UNIV AKRON,MAURICE MORTON INST POLYMER SCI,AKRON,OH 44325
关键词
D O I
10.1021/la00016a006
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Fullerene molecules (C60) have been tethered to the surface of an azide-terminated self-assembled monolayer. Results obtained from water contact angles, ellipsometry, X-ray photoelectron spectroscopy, and UV-vis spectroscopy were consistent with the successful attachment of fullerene to the monolayer. Atomic force microscopy shows smooth, homogeneous areas of monomolecular films with a microroughness of 0.5 nm. In these monolayers, fullerene molecules are packed in an ordered lattice corresponding to the {h00} faces of a face centered cubic unit cell with edge length 1.4 +/- 0.1 nm.
引用
收藏
页码:996 / 999
页数:4
相关论文
共 50 条
  • [31] Observation of topography inversion in atomic force microscopy of self-assembled monolayers
    Neves, BRA
    Leonard, DN
    Salmon, ME
    Russell, PE
    Troughton, EB
    [J]. NANOTECHNOLOGY, 1999, 10 (04) : 399 - 404
  • [32] Imaging and characterization of self-assembled soft nanostructures by atomic force microscopy
    de Souza, E. F.
    Teschke, O.
    [J]. NANOSCIENCE AND TECHNOLOGY, PTS 1 AND 2, 2007, 121-123 : 829 - 833
  • [33] Atomic force microscopy nanotribology study of oligothiophene self-assembled films
    Ratera, I
    Chen, J
    Murphy, A
    Ogletree, DF
    Fréchet, JMJ
    Salmeron, M
    [J]. NANOTECHNOLOGY, 2005, 16 (05) : S235 - S239
  • [34] Investigations of the growth of self-assembled octadecylsiloxane monolayers with atomic force microscopy
    Leitner, T
    Friedbacher, G
    Vallant, T
    Brunner, H
    Mayer, U
    Hoffmann, H
    [J]. MIKROCHIMICA ACTA, 2000, 133 (1-4) : 331 - 336
  • [35] α,ω-Dihexylsexithiophene Self-Assembled Nanostructures on Mica: Atomic Force Microscopy Study
    Wang, Li
    Ye, Shuhong
    Yuan, Huizhen
    Song, Yonghai
    Zhu, Haozhi
    Hou, Haoqing
    Li, Pengcheng
    [J]. MICROSCOPY AND MICROANALYSIS, 2012, 18 (04) : 844 - 851
  • [36] Bimodal atomic force microscopy for the characterization of thiolated self-assembled monolayers
    Athanasopoulou, Evangelia-Nefeli
    Nianias, Nikolaos
    Ong, Quy Khac
    Stellacci, Francesco
    [J]. NANOSCALE, 2018, 10 (48) : 23027 - 23036
  • [37] Investigations of the Growth of Self-Assembled Octadecylsiloxane Monolayers with Atomic Force Microscopy
    Thomas Leitner
    Gernot Friedbacher
    Thomas Vallant
    Helmuth Brunner
    Ulrich Mayer
    Helmuth Hoffmann
    [J]. Microchimica Acta, 2000, 133 : 331 - 336
  • [38] Conductive atomic force microscopy study of self-assembled silicon nanostructures
    Bari, M. R.
    Blaikie, R. J.
    Fang, F.
    Markwitz, A.
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2009, 27 (06): : 3051 - 3054
  • [39] Atomic force microscope based nanolithography of self-assembled organosilane monolayer resists
    Kim, J
    Oh, Y
    Lee, H
    Shin, Y
    Park, S
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (12B): : 7148 - 7150
  • [40] ATOMIC-FORCE MICROSCOPY
    BINNIG, GK
    [J]. PHYSICA SCRIPTA, 1987, T19A : 53 - 54