Investigations of the growth of self-assembled octadecylsiloxane monolayers with atomic force microscopy

被引：34
|
作者：
Leitner, T
Friedbacher, G
Vallant, T
Brunner, H
Mayer, U
Hoffmann, H
机构：
[1] Tech Univ Vienna, Inst Analyt Chem, A-1060 Vienna, Austria
[2] Tech Univ Vienna, Inst Anorgan Chem, A-1060 Vienna, Austria
来源：
MIKROCHIMICA ACTA | 2000年 / 133卷 / 1-4期
关键词：
self-assembled monolayers; AFM; in-situ measurements; growth kinetics;
D O I：
10.1007/s006040070115
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
Self-assembled monolayers of octadecylsiloxane were prepared and characterized by atomic force microscopy and ellipsometry. Parameters, like the residual water concentration of the solvent and the solution age, that affect both the surface coverage and the order of the film were investigated, Besides ex-situ measurements, also in-situ atomic force microscopy was used to characterize the growth and the kinetics of the adsorption process. Furthermore, self-assembly of organic films was used as a model system for studying the influence of the measurement process on in-situ experiments in the AFM liquid cell.
引用
收藏
页码：331 / 336
页数：6
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