Investigations of the Growth of Self-Assembled Octadecylsiloxane Monolayers with Atomic Force Microscopy

被引：0

作者：

Thomas Leitner

Gernot Friedbacher

Thomas Vallant

Helmuth Brunner

Ulrich Mayer

Helmuth Hoffmann

机构：

[1] Institut für Analytische Chemie,

[2] Technische Universität Wien,undefined

[3] Getreidemarkt 9/151,undefined

[4] A-1060 Wien,undefined

[5] Austria,undefined

[6] Institut für Anorganische Chemie,undefined

[7] Technische Universität Wien,undefined

[8] Getreidemarkt 9/153,undefined

[9] A-1060 Wien,undefined

[10] Austria,undefined

来源：

Microchimica Acta | 2000年 / 133卷

关键词：

Key words: Self-assembled monolayers; AFM; in-situ measurements; growth kinetics.;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Self-assembled monolayers of octadecylsiloxane were prepared and characterized by atomic force microscopy and ellipsometry. Parameters, like the residual water concentration of the solvent and the solution age, that affect both the surface coverage and the order of the film were investigated. Besides ex-situ measurements, also in-situ atomic force microscopy was used to characterize the growth and the kinetics of the adsorption process. Furthermore, self-assembly of organic films was used as a model system for studying the influence of the measurement process on in-situ experiments in the AFM liquid cell.

引用

页码：331 / 336

页数：5

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