Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy

被引：0
|
作者：
Neves, BRA
Salmon, ME
Leonard, DN
Troughton, EB
Russell, PE
机构：
[1] N Carolina State Univ, Analyt Instrumentat Facil, Raleigh, NC 27695 USA
[2] UFMG, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
[3] Lord Corp, Thomas Lord Res Ctr, Cary, NC 27512 USA
来源：
MICROBEAM ANALYSIS 2000, PROCEEDINGS | 2000年 / 165期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：367 / 368
页数：2
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