ABUNDANCE OF MOLECULAR-IONS IN SECONDARY ION MASS-SPECTROMETRY

被引：15
|
作者：
MORGAN, AE [1 ]
WERNER, HW [1 ]
机构：
[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
来源：
APPLIED PHYSICS | 1976年 / 11卷 / 02期
关键词：
D O I：
10.1007/BF00920605
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：193 / 195
页数：3
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