ABUNDANCE OF MOLECULAR-IONS IN SECONDARY ION MASS-SPECTROMETRY

被引：15

作者：

MORGAN, AE ^{[1
]}

WERNER, HW ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

APPLIED PHYSICS | 1976年 / 11卷 / 02期

关键词：

D O I：

10.1007/BF00920605

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：193 / 195

页数：3

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