Hardening FPGA-based systems against SEUs: A new design methodology

被引:0
|
作者
Sterpone, L. [1 ]
Violante, M. [1 ]
机构
[1] Politecn Torino, Dipartimento Automat & Informat, Turin, Italy
关键词
FPGA; SEU; fault tolerance;
D O I
暂无
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
SRAM-based Field Programmable Gate Arrays (FPGAs) are very susceptible to Single Event Upsets (SEUs) that may have dramatic effects on the circuits they implement. In this paper we present a design flow composed by both standard tools, and ad-hoc developed tools, which designers can use fruitfully for developing circuits resilient to SEUs. Experiments are reported on both benchmarks circuits and on a realistic circuit to show the capabilities of the proposed design flow.
引用
收藏
页码:22 / 30
页数:9
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