SCANNING ELECTRON-MICROSCOPES AND OTHER BEAM INSTRUMENTS FOR SPACEFLIGHT

被引：0

作者：

ALBEE, AL ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1987年 / 7卷 / 02期

关键词：

D O I：

暂无

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：137 / 137

页数：1

共 50 条

[41] CALIBRATION OF SCANNING ELECTRON-MICROSCOPES FOR MEASURING THE DIMENSIONS OF SUBMICRON RELIEF ELEMENTS
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[42] SMALL-SIZE HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPES
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[45] SIMPLE TECHNIQUE TO OBTAIN A POSITION MODULATED SCAN IN SCANNING ELECTRON-MICROSCOPES
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[47] CALCULATION OF THE SPHERICAL-ABERRATION OF THE SHAPING LENSES IN SCANNING ELECTRON-MICROSCOPES
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[48] APPLICATION OF REPLICA TECHNIQUES FOR USE WITH SCANNING ELECTRON-MICROSCOPES IN DENTAL RESEARCH
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[49] PRACTICAL AUTOALIGNMENT OF TRANSMISSION ELECTRON-MICROSCOPES
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[50] APPLICATION OF TURBOMOLECULAR PUMPS IN ELECTRON-MICROSCOPES
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