SCANNING ELECTRON-MICROSCOPES AND OTHER BEAM INSTRUMENTS FOR SPACEFLIGHT

被引：0

作者：

ALBEE, AL ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1987年 / 7卷 / 02期

关键词：

D O I：

暂无

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

下载

页码：137 / 137

页数：1

共 50 条

[21] MINIATURE PNEUMATIC TENSILE STAGE FOR SCANNING ELECTRON-MICROSCOPES
HOBBS, SY
REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (07): : 1097 - 1098
[22] HYDRAULIC STRAINING STAGE FOR USE IN SCANNING ELECTRON-MICROSCOPES
MANNING, MI
GOODHEW, PJ
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (06): : 464 - 466
[23] NEW ELECTRON-MICROSCOPES
不详
PATHOLOGIE BIOLOGIE, 1973, 21 (10): : 1153 - 1154
[24] MEASUREMENT OF LOCAL TEXTURES WITH TRANSMISSION AND SCANNING ELECTRON-MICROSCOPES
SCHWARZER, RA
TEXTURES AND MICROSTRUCTURES, 1990, 13 (01): : 15 - 30
[25] AUTOMATIZING ELECTRON-MICROSCOPES
VANDERMAST, KD
ULTRAMICROSCOPY, 1984, 14 (04) : 393 - 394
[26] PHOTOGRAMMETRIC SELF-CALIBRATION OF SCANNING ELECTRON-MICROSCOPES - SPIRAL DISTORTION COMPENSATION IS KEY TO ACCURATE 3-DIMENSIONAL MAPPING WITH SCANNING ELECTRON-MICROSCOPES
MAUNE, DF
PHOTOGRAMMETRIC ENGINEERING AND REMOTE SENSING, 1976, 42 (09): : 1161 - 1172
[27] DIGITAL MULTIPLE-STANDARD SYNCHROGENERATOR FOR SCANNING ELECTRON-MICROSCOPES
KOROLEV, GV
BALOBANOV, VG
KULYAS, OL
KAMALYAGIN, AA
DANILOV, AV
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1982, 25 (05) : 1252 - 1255
[28] COMBINATION OF SCANNING TUNNEL AND RASTER ELECTRON-MICROSCOPES IN ONE DEVICE
VOLODIN, AP
KOPETSKII, CV
STEPANYAN, GA
KHAIKIN, MS
EDELMAN, VS
PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1987, 13 (20): : 1251 - 1255
[29] COMPUTERS AND ELECTRON-MICROSCOPES
EADES, JA
ULTRAMICROSCOPY, 1988, 24 (01) : R5 - R6
[30] FIELD-EMISSION CATHODES FOR CWIKSCAN SCANNING ELECTRON-MICROSCOPES
KHATAPOVA, RM
ROMANOVA, VK
DEMSKAYA, LL
GUSHCHIN, VA
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1985, 28 (03) : 727 - 728

← 1 2 3 4 5 →