SCANNING ELECTRON-MICROSCOPES AND OTHER BEAM INSTRUMENTS FOR SPACEFLIGHT

被引：0

作者：

ALBEE, AL ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1987年 / 7卷 / 02期

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中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

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页码：137 / 137

页数：1

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[31] OBSERVATION OF GRAPHITE STRUCTURE UNDER OPTICAL AND SCANNING ELECTRON-MICROSCOPES
NARENDRANATH, CS
ROHATGI, PK
YEGNESWARAN, AH
JOURNAL OF MATERIALS SCIENCE LETTERS, 1986, 5 (06) : 592 - 594
[32] USE OF SCANNING AND TRANSMISSION ELECTRON-MICROSCOPES FOR FRACTOGRAPHIC ANALYSIS OF STEELS
KALNER, VD
ZELENOVA, VD
SHERMAZAN, IV
KIRILLOVA, MP
METAL SCIENCE AND HEAT TREATMENT, 1974, 16 (7-8) : 656 - 659
[33] OXIDATION PROBLEMS DURING SINTERING OF METALLIC MATERIALS IN ELECTRON OR SCANNING ELECTRON-MICROSCOPES
HAJMRLE, K
ANGERS, R
METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1976, 7 (05): : 762 - 764
[34] SIMPLE METHOD FOR DETERMINING ACCELERATION POTENTIAL IN ELECTRON PROBES AND SCANNING ELECTRON-MICROSCOPES
SOLOSKY, LF
BEAMAN, DR
REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (08): : 1100 - &
[35] CHARACTERIZATION OF ISOLATED EPIDERMAL-CELLS IN SCANNING AND TRANSMISSION ELECTRON-MICROSCOPES
DROCHMANS, P
PENASSE, W
LAURENT, L
LELOUP, R
JOURNAL DE MICROSCOPIE ET DE BIOLOGIE CELLULAIRE, 1976, 26 (2-3): : A11 - A11
[36] CONSTRUCTION OF 35-MILLIMETER CAMERA ADAPTERS FOR SCANNING ELECTRON-MICROSCOPES
MILLER, MM
HARDY, J
REVEL, JP
RUSNAK, M
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1987, 6 (01): : 31 - 34
[37] RECENT IMPROVEMENT OF ELECTRON-MICROSCOPES
TAOKA, T
JOURNAL OF ELECTRON MICROSCOPY, 1976, 25 (01): : 62 - 62
[38] PHASE PLATES FOR ELECTRON-MICROSCOPES
MULLER, KH
OPTIK, 1976, 45 (01): : 73 - 85
[39] TEST OBJECT FOR ELECTRON-MICROSCOPES
BEZRUK, LI
ESAULENKO, GB
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1983, 26 (04) : 966 - 968
[40] SPECKLE METHOD WITH ELECTRON-MICROSCOPES
CHIANG, FP
EXPERIMENTAL MECHANICS, 1982, 22 (05) : N46 - N46

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