SCANNING ELECTRON-MICROSCOPES AND OTHER BEAM INSTRUMENTS FOR SPACEFLIGHT

被引：0
|
作者：
ALBEE, AL [1 ]
机构：
[1] CALTECH,PASADENA,CA 91125
来源：
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1987年 / 7卷 / 02期
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中图分类号：
Q [生物科学];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
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页码：137 / 137
页数：1
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