ENHANCEMENT MODE N-CHANNEL SI/SIGE MODFET WITH HIGH INTRINSIC TRANSCONDUCTANCE

被引:71
|
作者
KONIG, U
BOERS, AJ
SCHAFFLER, F
KASPER, E
机构
[1] Daimler-Benz AG, Research Center, 7900 Ulm
关键词
FIELD-EFFECT TRANSISTORS; TRANSISTORS; SEMICONDUCTOR DEVICES AND MATERIALS;
D O I
10.1049/el:19920100
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
n-channel Si/SiGe MODFETs with quantum wells grown on a thick (1.5-mu-m) graded buffer (Ge 5-30%) are realised. MODFETs with a surface gate work in the depletion mode due to a large gate-to-2-DEG channel distance of 75 nm. MODFETs with a recessed gate 10-15 nm above the channel exhibit enhancement mode operation with significantly high extrinsic transconductances of 340 mS/mm or 670 mS/mm at 300 K or 77 K and corresponding intrinsic transconductances of 380 mS/mm or 800 mS/mm. The performance indicates the improved layer quality on graded buffers.
引用
收藏
页码:160 / 162
页数:3
相关论文
共 50 条
  • [1] Investigation of capacitance voltage characteristics of strained Si/SiGe n-channel MODFET varactor
    Elogail, Y.
    Kasper, E.
    Gunzer, F.
    Shaker, A.
    Schulze, J.
    SOLID STATE SCIENCES, 2016, 56 : 73 - 78
  • [2] N-CHANNEL SI/SIGE MODFET - EFFECTS OF RAPID THERMAL-ACTIVATION ON THE DC PERFORMANCE
    KONIG, U
    BOERS, AJ
    SCHAFFLER, F
    IEEE ELECTRON DEVICE LETTERS, 1993, 14 (03) : 97 - 99
  • [3] Enhancement-mode GaAs n-channel MOSFET
    Rajagopalan, Karthik
    Abrokwah, Jonathan
    Droopad, Ravi
    Passlack, Matthias
    IEEE ELECTRON DEVICE LETTERS, 2006, 27 (12) : 959 - 962
  • [4] Study of n-channel enhancement mode InP MISFETS
    Jiang, Ruolian
    Zheng, Youdou
    Wang, Renkang
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1988, 9 (05): : 451 - 458
  • [5] Optimization of alloy composition for high-performance strained-Si-SiGe n-channel MOSFETs
    Olsen, SH
    O'Neill, AG
    Driscoll, LS
    Chattopadhyay, S
    Kwa, KSK
    Waite, AM
    Tang, YT
    Evans, AGR
    Zhang, J
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2004, 51 (07) : 1156 - 1163
  • [6] Optimised n-channel Si/SiGe HFETs design for VTH shift immunity
    Jeamsaksiri, W
    Velázquez, JE
    Fobelets, K
    SOLID-STATE ELECTRONICS, 2002, 46 (12) : 2241 - 2245
  • [7] QUANTUM INTERFERENCE IN THE N-CHANNEL OF A SI-SIGE QUANTUM-WELL
    PRASAD, RS
    THORNTON, TJ
    MATSUMURA, A
    FERNANDEZ, JM
    WILLIAMS, D
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1995, 10 (08) : 1084 - 1088
  • [8] High mobility SiGe/Si n-MODFET structures and devices on sapphire substrates
    Mueller, C
    Alterovitz, S
    Croke, E
    Ponchak, G
    HIGH-MOBILITY GROUP-IV MATERIALS AND DEVICES, 2004, 809 : 193 - 198
  • [9] High electron mobility in SiGe/Si n-MODFET structures on sapphire substrates
    Mueller, CH
    Croke, ET
    Alterovitz, SA
    ELECTRONICS LETTERS, 2003, 39 (18) : 1353 - 1354
  • [10] High-temperature enhancement mode operation of n-channel GaN MOSFETs on sapphire substrates
    Nomura, Takehiko
    Kambayashi, Hiroshi
    Niiyama, Yuki
    Otomo, Shinya
    Yoshida, Seikoh
    SOLID-STATE ELECTRONICS, 2008, 52 (01) : 150 - 155