ENHANCEMENT MODE N-CHANNEL SI/SIGE MODFET WITH HIGH INTRINSIC TRANSCONDUCTANCE

被引:71
|
作者
KONIG, U
BOERS, AJ
SCHAFFLER, F
KASPER, E
机构
[1] Daimler-Benz AG, Research Center, 7900 Ulm
关键词
FIELD-EFFECT TRANSISTORS; TRANSISTORS; SEMICONDUCTOR DEVICES AND MATERIALS;
D O I
10.1049/el:19920100
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
n-channel Si/SiGe MODFETs with quantum wells grown on a thick (1.5-mu-m) graded buffer (Ge 5-30%) are realised. MODFETs with a surface gate work in the depletion mode due to a large gate-to-2-DEG channel distance of 75 nm. MODFETs with a recessed gate 10-15 nm above the channel exhibit enhancement mode operation with significantly high extrinsic transconductances of 340 mS/mm or 670 mS/mm at 300 K or 77 K and corresponding intrinsic transconductances of 380 mS/mm or 800 mS/mm. The performance indicates the improved layer quality on graded buffers.
引用
收藏
页码:160 / 162
页数:3
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