ION-BEAM CRYSTALLOGRAPHY OF SILICON SURFACES .4. SI(111)-(2 X-1)

被引：17
|
作者：
SMIT, L [1 ]
TROMP, RM [1 ]
VANDERVEEN, JF [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
SURFACE SCIENCE | 1985年 / 163卷 / 2-3期
关键词：
D O I：
10.1016/0039-6028(85)91063-5
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：315 / 334
页数：20
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