X-RAY TOPOGRAPHY ON SEMICONDUCTOR CRYSTALS

被引：0
|
作者：
BARTELS, WJ [1 ]
机构：
[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
来源：
ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1985年 / 170卷 / 1-4期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：6 / 7
页数：2
相关论文
共 50 条
  • [1] Synchrotron radiation x-ray topography applied to nitride semiconductor crystals
    Zhang, Qirui
    Lv, Songyang
    Liu, Lei
    Wang, Shouzhi
    Wang, Guodong
    Yu, Jiaoxian
    Lv, Lingshuang
    Xu, Xiangang
    Zhang, Lei
    JOURNAL OF APPLIED PHYSICS, 2024, 135 (18)
  • [2] X-RAY TOPOGRAPHY OF CDTE CRYSTALS
    GHEZZI, C
    PAORICI, C
    JOURNAL OF CRYSTAL GROWTH, 1974, 21 (01) : 58 - 60
  • [3] X-ray topography of lysozyme crystals
    Izumi, K
    Sawamura, S
    Ataka, M
    JOURNAL OF CRYSTAL GROWTH, 1996, 168 (1-4) : 106 - 111
  • [4] X-RAY TOPOGRAPHY OF TWINNED CRYSTALS
    KLAPPER, H
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1987, 14 : 367 - 401
  • [5] X-RAY TOPOGRAPHY OF BENT CRYSTALS
    CHUKHOVSKII, FN
    PETRASHEN, PV
    ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 : 8 - 14
  • [6] GROWTH AND MELTING PROCESSES OF SEMICONDUCTOR CRYSTALS OBSERVED BY LIVE X-RAY TOPOGRAPHY
    CHIKAWA, J
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1993, 26 : 255 - 265
  • [7] X-RAY TOPOGRAPHY WITH A SEMICONDUCTOR TV SYSTEM
    GERMER, R
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1987, 100 (01): : 47 - 51
  • [8] HIGH-TEMPERATURE CAMERA FOR INSITU EXAMINATION OF SEMICONDUCTOR CRYSTALS BY X-RAY TOPOGRAPHY
    SMOLSKII, IL
    DILBARYAN, GA
    ROZHANSKII, VN
    INDUSTRIAL LABORATORY, 1984, 50 (05): : 465 - 467
  • [9] X-Ray Topography Study of Microsegregation in Crystals
    Prokhorov, I. A.
    Bezbakh, I. Z.
    Zakharov, B. G.
    Shul'pina, I. L.
    JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES, 2007, 1 (03) : 260 - 264
  • [10] X-ray topography study of microsegregation in crystals
    I. A. Prokhorov
    I. Z. Bezbakh
    B. G. Zakharov
    I. L. Shul’pina
    Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2007, 1 : 260 - 264
12345