X-RAY TOPOGRAPHY ON SEMICONDUCTOR CRYSTALS

被引：0
|
作者：
BARTELS, WJ [1 ]
机构：
[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
来源：
ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1985年 / 170卷 / 1-4期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：6 / 7
页数：2
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