X-RAY TOPOGRAPHY OF TWINNED CRYSTALS

被引：31
|
作者：
KLAPPER, H
机构：
来源：
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1987年 / 14卷
关键词：
D O I：
10.1016/0146-3535(87)90023-2
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：367 / 401
页数：35
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