NEW HEURISTIC TEST GENERATION ALGORITHM FOR SEQUENTIAL CIRCUITS

被引：0
|
作者：
ARIMA, T
TSUBOYA, M
AMAMIYA, G
OKUDA, J
机构：
[1] NIPPON ELECT CO LTD,ENGN DEPT,ELECTR SWITCHING DIV,33-1 SHIBA GOCHOME,MINATO,TOKYO,JAPAN
[2] NIPPON ELECT CO LTD,SOFTWARE DEV DEPT,ELECTR SWITCHING DIV,33-1 SHIBA GOCHOME,MINATO,TOKYO,JAPAN
来源：
NEC RESEARCH & DEVELOPMENT | 1975年 / 36期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：59 / 67
页数：9
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