A TEST-PATTERN-GENERATION ALGORITHM FOR SEQUENTIAL-CIRCUITS

被引：6
|
作者：
AUTH, E
SCHULZ, MH
机构：
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1991年 / 8卷 / 02期
关键词：
D O I：
10.1109/54.82040
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The authors present a deterministic test-pattern-generation algorithm for synchronous sequential circuits. The algorithm is based on the well-known method of reverse time processing, but it applies forward processing within time frames to avoid disadvantageous a priori determination of a path to be sensitized or of a primary output to which the fault effects must be propagated. The authors’ approach exploits techniques used for combinational circuits in the automatic test-pattern-generation system Socrates. © 1991 IEEE
引用
收藏
页码：72 / 86
页数：15
相关论文
共 50 条
12345