Study and optimization of the photoluminescence of amorphous silicon carbide thin films

被引:0
|
作者
Maricela Meneses
Mario Moreno
Alfredo Morales
Alfonso Torres
Pedro Rosales
Israel Vivaldo
机构
[1] Instituto Nacional de Astrofísica,Óptica y Electrónica, INAOE
[2] Centro de Investigación en Materiales Avanzados,FCE, BUAP
[3] S.C.,undefined
[4] CIMAV-Unidad Monterrey,undefined
[5] Benemerita Universidad Autónoma de Puebla,undefined
[6] 72000,undefined
关键词
D O I
10.1557/adv.2019.1
中图分类号
学科分类号
摘要
In this work we report the study of the effect of the deposition parameters on the photoluminescence (PL) intensity of hydrogenated amorphous silicon-carbide (a-SiC:H) films deposited at very low temperature (150 °C) by Plasma Enhanced Chemical Vapor Deposition (PECVD). We have observed that the main deposition parameter that influences the wavelength emission peak is the methane/silane (CH4/SiH4) ratio used for the films deposition, due to a change on the film carbon content. On the other hand the deposition RF power affects the PL intensity, without a change in the PL emission peak. Also we have studied the effect of the film thickness on the PL intensity and we have observed an optimal film thickness.
引用
收藏
页码:3905 / 3916
页数:11
相关论文
共 50 条
  • [21] A study of silicon suboxide thin films by photoluminescence
    Wang, F
    Wolfe, DM
    Hinds, BJ
    Lucovsky, G
    Platz, R
    Wagner, S
    AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 1998, 507 : 267 - 272
  • [22] Comparative analysis of thin films of hydrogenated and unhydrogenated amorphous silicon carbide
    Vasin, A.V.
    Rusavskij, A.V.
    Starik, S.P.
    Kushnirenko, V.I.
    Kutsaj, A.M.
    Nazarov, A.N.
    Lysenko, V.S.
    Semenov, A.V.
    Puzikov, V.M.
    Gontar', A.G.
    Dub, S.N.
    Sverkhtverdye Materialy, 2004, (03): : 36 - 46
  • [23] The influence of carbon on the structure and photoluminescence of amorphous silicon carbonitride thin films
    Khatami, Z.
    Wilson, P. R.
    Wojcik, J.
    Mascher, P.
    THIN SOLID FILMS, 2017, 622 : 1 - 10
  • [24] The influence of carbon on the structure and photoluminescence of amorphous silicon carbonitride thin films
    Khatami, Z.
    Wilson, P. R. J.
    Dunn, K.
    Wojcik, J.
    Mascher, P.
    NANOSCALE LUMINESCENT MATERIALS 2, 2012, 45 (05): : 153 - 160
  • [25] Characterization of nitrogen-doped amorphous silicon carbide thin films
    Slovak Acad of Sciences, Bratislava, Slovakia
    Vacuum, 2 (165-167):
  • [26] High temperature annealing of hydrogenated amorphous silicon carbide thin films
    Wang, YH
    Lin, JY
    Huan, CHA
    Feng, ZC
    Chua, SJ
    THIN SOLID FILMS, 2001, 384 (02) : 173 - 176
  • [27] Spectroscopy and structural properties of amorphous and nanocrystalline silicon carbide thin films
    Halindintwali, Sylvain
    Knoesen, D.
    Julies, B. A.
    Arendse, C. J.
    Muller, T.
    Gengler, Regis Y. N.
    Rudolf, P.
    van Loosdrecht, P. H. M.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 9, 2011, 8 (09): : 2661 - 2664
  • [28] Structural relaxation of amorphous silicon carbide thin films in thermal annealing
    Xue, Kun
    Niu, Li-Sha
    Shi, Hui-Ji
    Liu, Jiwen
    THIN SOLID FILMS, 2008, 516 (12) : 3855 - 3861
  • [29] Effect of deposition temperature on the properties of amorphous silicon carbide thin films
    Huran, J.
    Hotovy, I.
    Pezoltd, J.
    Balalykin, N. I.
    Kobzev, A. P.
    THIN SOLID FILMS, 2006, 515 (02) : 651 - 653
  • [30] Characterization of nitrogen-doped amorphous silicon carbide thin films
    Safrankova, J
    Huran, J
    Hotovy, I
    Kobzev, AP
    Korenev, SA
    VACUUM, 1998, 51 (02) : 165 - 167