Power-Driven Routing-Constrained Scan Chain Design

被引：0

作者：

Y. Bonhomme

P. Girard

L. Guiller

C. Landrault

S. Pravossoudovitch

机构：

[1] UMR 5506 Université Montpellier II/CNRS,Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier

[2] Synopsys,undefined

[3] Inc.,undefined

来源：

Journal of Electronic Testing | 2004年 / 20卷

关键词：

DfT; low power testing; scan testing; scan chain design;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Scan-based architectures, though widely used in modern designs, are expensive in power consumption. In this paper, we present a new technique that allows to design power-optimized scan chains under a given routing constraint. The proposed technique is a three-phase process based on clustering and reordering of scan cells in the design. It allows to reduce average power consumption during scan testing. Owing to this technique, short scan connections in scan chains are guaranteed and congestion problems in the design are avoided.

引用

页码：647 / 660

页数：13

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