Al- and Al:In-Doped ZnO Thin Films Deposited by RF Magnetron Sputtering for Spacecraft Charge Mitigation

被引：0

作者：

C. Lennon

R. Kodama

Y. Chang

S. Sivananthan

M. Deshpande

机构：

[1] University of Illinois at Chicago,Microphysics Laboratory, Department of Physics

[2] AMSENG,undefined

[3] Inc,undefined

来源：

Journal of Electronic Materials | 2008年 / 37卷

关键词：

Zinc oxide; RF magnetron sputtering; radiation hardness; transparent conducting oxide; orbital stability;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We investigate the utility of impurity-doped ZnO as charge-mitigating thin films for spacecraft in geosynchronous orbit. Satellite solar panel cover glass and thermal control blankets are commonly coated in tin-doped indium oxide which serves as a leakage path for accumulated surface charge. The increase in demand for indium has generated interest in alternative space-stable satellite coatings. We demonstrate the orbital stability of Al- and Al:In-doped ZnO exposed to a high-energy electron flux and simulated solar ultraviolet (UV) radiation.

引用

页码：1324 / 1328

页数：4

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