Atomic Force Microscope nanolithography on chromosomes to generate single-cell genetic probes

被引：0
|
作者：
Sebastiano Di Bucchianico
Anna M Poma
Maria F Giardi
Luana Di Leandro
Francesco Valle
Fabio Biscarini
Dario Botti
机构：
[1] University of L'Aquila,Department of Basic and Applied Biology
[2] Institute for Nanostructured Materials,undefined
[3] Consiglio Nazionale delle Ricerche ISMN-CNR,undefined
来源：
Journal of Nanobiotechnology | / 9卷
关键词：
Atomic Force Microscope; Painting Probe; Conventional Fluorescence Microscope; IX71 Inverted Fluorescence Microscope; Olympus IX71 Inverted Fluorescence Microscope;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Nanolithography by displacement of catalytic metal clusters using an atomic force microscope tip
    Brandow, SL
    Dressick, WJ
    Dulcey, CS
    Koloski, TS
    Shirey, LM
    Schmidt, J
    Calvert, JM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (05): : 1818 - 1824
  • [42] Atomic force microscope nanolithography of graphene: Cuts, pseudocuts, and tip current measurements
    Puddy, R. K.
    Scard, P. H.
    Tyndall, D.
    Connolly, M. R.
    Smith, C. G.
    Jones, G. A. C.
    Lombardo, A.
    Ferrari, A. C.
    Buitelaar, M. R.
    APPLIED PHYSICS LETTERS, 2011, 98 (13)
  • [43] Transport spectroscopy of a graphene quantum dot fabricated by atomic force microscope nanolithography
    Puddy, R. K.
    Chua, C. J.
    Buitelaar, M. R.
    APPLIED PHYSICS LETTERS, 2013, 103 (18)
  • [44] Atomic force microscope nanolithography: dip-pen, nanoshaving, nanografting, tapping mode, electrochemical and thermal nanolithography
    Rosa, Luis G.
    Liang, Jian
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2009, 21 (48)
  • [45] Modelling of conductive atomic force microscope probes for scanning tunnelling microscope operation
    Ozcan, O.
    Sitti, M.
    MICRO & NANO LETTERS, 2012, 7 (04): : 329 - 333
  • [46] Optical Microscope combined with the Nanopipette-based Quartz Tuning Fork - Atomic Force Microscope for Nanolithography
    An, Sangmin
    Stambaugh, Corey
    Kwon, Soyoung
    Lee, Kunyoung
    Kim, Bongsu
    Kim, Qwhan
    Jhe, Wonho
    NANOENGINEERING: FABRICATION, PROPERTIES, OPTICS, AND DEVICES X, 2013, 8816
  • [47] Direct measurement of the force of adhesion of a single biological cell using an atomic force microscope
    Bowen, WR
    Hilal, N
    Lovitt, RW
    Wright, CJ
    COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 1998, 136 (1-2) : 231 - 234
  • [48] Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography
    Zhou, H
    Midha, A
    Bruchhaus, L
    Mills, G
    Donaldson, L
    Weaver, JMR
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (05): : 1954 - 1958
  • [49] Nonlinear vibrations of atomic force microscope probes in Hertzian contact
    Wei, B
    Turner, JA
    REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 20A AND 20B, 2001, 557 : 1658 - 1665
  • [50] Calibration Methods and Error Analysis of the Lateral Force of Atomic Force Microscope Probes
    Lang H.
    Peng Y.
    Bao Q.
    Ding S.
    Huang Y.
    Jixie Gongcheng Xuebao/Journal of Mechanical Engineering, 2023, 59 (22): : 196 - 206
12345