Atomic Force Microscope nanolithography on chromosomes to generate single-cell genetic probes

被引:0
|
作者
Sebastiano Di Bucchianico
Anna M Poma
Maria F Giardi
Luana Di Leandro
Francesco Valle
Fabio Biscarini
Dario Botti
机构
[1] University of L'Aquila,Department of Basic and Applied Biology
[2] Institute for Nanostructured Materials,undefined
[3] Consiglio Nazionale delle Ricerche ISMN-CNR,undefined
关键词
Atomic Force Microscope; Painting Probe; Conventional Fluorescence Microscope; IX71 Inverted Fluorescence Microscope; Olympus IX71 Inverted Fluorescence Microscope;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Single Cell Scraper Based on an Atomic Force Microscope
    Adachi, Makoto
    Mizuguchi, Yuya
    Iwata, Futoshi
    2012 INTERNATIONAL SYMPOSIUM ON MICRO-NANOMECHATRONICS AND HUMAN SCIENCE (MHS), 2012, : 64 - 69
  • [22] A method for simulating Atomic Force Microscope nanolithography in the Level Set framework
    Filipovic, Lado
    Selberherr, Siegfried
    MICROELECTRONIC ENGINEERING, 2013, 107 : 23 - 32
  • [23] Advances in atomic force microscopy for single-cell analysis
    Li, Mi
    Xi, Ning
    Wang, Yuechao
    Liu, Lianqing
    NANO RESEARCH, 2019, 12 (04) : 703 - 718
  • [25] Advances in atomic force microscopy for single-cell analysis
    Mi Li
    Ning Xi
    Yuechao Wang
    Lianqing Liu
    Nano Research, 2019, 12 : 703 - 718
  • [26] Atomic force microscope nanolithography on SiO2/semiconductor surfaces
    Avramescu, A
    Uesugi, K
    Suemune, I
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (6B): : 4057 - 4060
  • [27] IMAGING AND MANIPULATING CHROMOSOMES WITH THE ATOMIC-FORCE MICROSCOPE
    JONDLE, DM
    AMBROSIO, L
    VESENKA, J
    HENDERSON, E
    CHROMOSOME RESEARCH, 1995, 3 (04) : 239 - 244
  • [28] On the dynamics of tapping mode atomic force microscope probes
    Bahrami, Arash
    Nayfeh, Ali H.
    NONLINEAR DYNAMICS, 2012, 70 (02) : 1605 - 1617
  • [29] Coaxial atomic force microscope probes for imaging with dielectrophoresis
    Brown, Keith A.
    Berezovsky, Jesse
    Westervelt, R. M.
    APPLIED PHYSICS LETTERS, 2011, 98 (18)
  • [30] Characterization of atomic force microscope probes at low temperatures
    Bystrenova, E. (Eva.Bystrenova@ipmc.unil.ch), 1600, American Institute of Physics Inc. (94):