Characterization of atomic force microscope probes at low temperatures

被引：0
|
作者：
机构：
[1] Radenovic, Alexandra
[2] Bystrenova, Eva
[3] Libioulle, Laurent
[4] Valle, Francesco
[5] 1,Shubeita, George T.
[6] 2,Kasas, Sandor
[7] Dietler, Giovanni
来源：
Bystrenova, E. (Eva.Bystrenova@ipmc.unil.ch) | 1600年 / American Institute of Physics Inc.卷 / 94期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Characterization of atomic force microscope probes at low temperatures
    Radenovic, A
    Bystrenova, E
    Libioulle, L
    Valle, F
    Shubeita, GT
    Kasas, S
    Dietler, G
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (06) : 4210 - 4214
  • [2] Modulus characterization of cells with submicron colloidal probes by atomic force microscope
    Lei, Xiaojiao
    Li, Huiqin
    Han, Yao
    Li, Jinjin
    Yu, Fan
    Liang, Qi
    MICROSCOPY RESEARCH AND TECHNIQUE, 2022, 85 (03) : 882 - 891
  • [3] Scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures
    Allers, W
    Schwarz, A
    Schwarz, UD
    Wiesendanger, R
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (01): : 221 - 225
  • [4] Characterization of Akiyama probe applied to Dual-probes Atomic Force Microscope
    Wang Hequn
    Gao Sitian
    Li Wei
    Shi Yushu
    Li Qi
    Li Shi
    Zhu Zhendong
    OPTICAL MEASUREMENT TECHNOLOGY AND INSTRUMENTATION, 2016, 10155
  • [5] On the dynamics of tapping mode atomic force microscope probes
    Bahrami, Arash
    Nayfeh, Ali H.
    NONLINEAR DYNAMICS, 2012, 70 (02) : 1605 - 1617
  • [6] Coaxial atomic force microscope probes for imaging with dielectrophoresis
    Brown, Keith A.
    Berezovsky, Jesse
    Westervelt, R. M.
    APPLIED PHYSICS LETTERS, 2011, 98 (18)
  • [7] Atomic force microscope based on vertical silicon probes
    Walter, Benjamin
    Mairiaux, Estelle
    Faucher, Marc
    APPLIED PHYSICS LETTERS, 2017, 110 (24)
  • [8] Chemically-specific probes for the atomic force microscope
    Lee, GU
    Chrisey, LA
    OFerrall, CE
    Pilloff, DE
    Turner, NH
    Colton, RJ
    ISRAEL JOURNAL OF CHEMISTRY, 1996, 36 (01) : 81 - 87
  • [9] On the dynamics of tapping mode atomic force microscope probes
    Arash Bahrami
    Ali H. Nayfeh
    Nonlinear Dynamics, 2012, 70 : 1605 - 1617
  • [10] Attachment of carbon nanotubes to atomic force microscope probes
    Gibson, Christopher T.
    Carnally, Stewart
    Roberts, Clive J.
    ULTRAMICROSCOPY, 2007, 107 (10-11) : 1118 - 1122
12345