Characterization of atomic force microscope probes at low temperatures

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[1] Radenovic, Alexandra
[2] Bystrenova, Eva
[3] Libioulle, Laurent
[4] Valle, Francesco
[5] 1,Shubeita, George T.
[6] 2,Kasas, Sandor
[7] Dietler, Giovanni
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Bystrenova, E. (Eva.Bystrenova@ipmc.unil.ch) | 1600年 / American Institute of Physics Inc.卷 / 94期
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