Importance sampling method of correction for multiple testing in affected sib-pair linkage analysis

被引:0
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作者
Alison P Klein
Ilija Kovac
Alexa JM Sorant
Agnes Baffoe-Bonnie
Betty Q Doan
Grace Ibay
Erica Lockwood
Diptasri Mandal
Lekshmi Santhosh
Karen Weissbecker
Jessica Woo
April Zambelli-Weiner
Jie Zhang
Daniel Q Naiman
James Malley
Joan E Bailey-Wilson
机构
[1] Inherited Disease Research Branch,Department of Genetics
[2] NHGRI,Department of Psychiatry and Neurology and the Hayward Genetics Program
[3] NIH,Department of Epidemiology, Bloomberg School of Public Health
[4] Fox Chase Cancer Center,Department of Mathematical Sciences
[5] CIDR,undefined
[6] Johns Hopkins Medical School,undefined
[7] Louisiana State University Health Sciences Center,undefined
[8] Tulane University,undefined
[9] Johns Hopkins University,undefined
[10] Johns Hopkins University,undefined
[11] Center for Information Technology,undefined
[12] NIH,undefined
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关键词
Importance Sampling; Exceedance Probability; Bonferroni Method; Genetic Analysis Workshop; Marker Test;
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摘要
Using the Genetic Analysis Workshop 13 simulated data set, we compared the technique of importance sampling to several other methods designed to adjust p-values for multiple testing: the Bonferroni correction, the method proposed by Feingold et al., and naïve Monte Carlo simulation. We performed affected sib-pair linkage analysis for each of the 100 replicates for each of five binary traits and adjusted the derived p-values using each of the correction methods. The type I error rates for each correction method and the ability of each of the methods to detect loci known to influence trait values were compared. All of the methods considered were conservative with respect to type I error, especially the Bonferroni method. The ability of these methods to detect trait loci was also low. However, this may be partially due to a limitation inherent in our binary trait definitions.
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