Practical Fault Localization with Combinatorial Test Design

被引：6

作者：

Blue, Dale ^{[1
]}

Hicks, Andrew ^{[1
]}

Rawlins, Ryan ^{[1
]}

Tzoref-Brill, Rachel ^{[2
]}

机构：

[1] IBM Corp, Armonk, NY 10504 USA

[2] IBM Res, Haifa, Israel

来源：

2019 IEEE 12TH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW 2019) | 2019年

关键词：

D O I：

10.1109/ICSTW.2019.00063

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

Combinatorial test design is a well-known effective technique for test planning. However, in order to fully realize its potential in industrial settings, it needs to be considered as an integral part of the end to end testing flow rather than as an isolated component. In this work, we present an automated end to end solution for CTD-based test optimization, generation, execution and fault localization, implemented in an industrial framework. We further report on our initial promising experience in applying it to an industrial product.

引用

页码：268 / 271

页数：4

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