Practical Fault Localization with Combinatorial Test Design

被引：6

作者：

Blue, Dale ^{[1
]}

Hicks, Andrew ^{[1
]}

Rawlins, Ryan ^{[1
]}

Tzoref-Brill, Rachel ^{[2
]}

机构：

[1] IBM Corp, Armonk, NY 10504 USA

[2] IBM Res, Haifa, Israel

来源：

2019 IEEE 12TH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW 2019) | 2019年

关键词：

D O I：

10.1109/ICSTW.2019.00063

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

Combinatorial test design is a well-known effective technique for test planning. However, in order to fully realize its potential in industrial settings, it needs to be considered as an integral part of the end to end testing flow rather than as an isolated component. In this work, we present an automated end to end solution for CTD-based test optimization, generation, execution and fault localization, implemented in an industrial framework. We further report on our initial promising experience in applying it to an industrial product.

引用

页码：268 / 271

页数：4

共 50 条

[31] AN ALGORITHM FOR FAULT DIAGNOSIS BASED ON COMBINATORIAL DESIGN APPROACH FOR TESTING
Nie Changhai Xu Baowen Shi Liang (Dept. of Computer Science & Eng.
JournalofElectronics(China), 2003, (03) : 224 - 226
[32] THE PRACTICAL DESIGN OF ULTRASONIC TEST TANKS
AINDOW, JD
CHIVERS, RC
ULTRASONICS, 1984, 22 (03) : 139 - 141
[33] How to design practical test cases
Yamaura, T
IEEE SOFTWARE, 1998, 15 (06) : 30 - +
[34] Fault Localization With Weighted Test Model in Model Transformations
Li, Pengfei
Jiang, Mingyue
Ding, Zuohua
IEEE ACCESS, 2020, 8 : 14054 - 14064
[35] UnitFL: A Fault Localization Tool Integrated with Unit Test
Chen, Cheng
Wang, Nan
PROCEEDINGS OF 2016 5TH INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE AND NETWORK TECHNOLOGY (ICCSNT), 2016, : 136 - 142
[36] Simulating the Effect of Test Flakiness on Fault Localization Effectiveness
Vancsics, Bela
Gergely, Tamas
Beszedes, Arpad
VST '20: PROCEEDINGS OF THE 2020 IEEE 3RD INTERNATIONAL WORKSHOP ON VALIDATION, ANALYSIS, AND EVOLUTION OF SOFTWARE TESTS, 2020, : 28 - 35
[37] Targeted Memory Test for Enhanced Diagnostic Fault Localization
Safran, Laura
Hodge, Christopher
Sylvestri, John
ISTFA 2017: CONFERENCE PROCEEDINGS FROM THE 43RD INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2017, : 511 - 519
[38] Towards interactive fault localization using test information
Hao, Dan
Zhang, Lu
Mei, Hong
Sun, Jiasu
ASPEC 2006: 13TH ASIA-PACIFIC SOFTWARE ENGINEERING CONFERENCE, PROCEEDINGS, 2006, : 277 - +
[39] A Composition-Based Method for Combinatorial Test Design
Zamansky, Anna
Shwartz, Amir
Khoury, Seri
Farchi, Eitan
10TH IEEE INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS - ICSTW 2017, 2017, : 249 - 252
[40] Combinatorial Test Design - A smarter way to connect with the business
Route, Saritha
Pendela, Sudheer
2018 IEEE 11TH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW), 2018, : 306 - 307

← 1 2 3 4 5 →