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Design of an experimental system for dual energy X-ray CT
被引:0
|作者:
Sukovic, P
[1
]
Clinthorne, NH
[1
]
机构:
[1] Univ Michigan, Ann Arbor, MI 48109 USA
关键词:
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We present the design of a dual energy (DE) X-ray computed tomography (CT) test bench. It employs amorphous silicon (a-Si:H) imaging arrays and helical cone-beam geometry. Our goals are to evaluate: (1) the applicability of a-Si:H imaging arrays for tomography; (2) how our previously published dual energy penalized weighted least squares (DE PWLS) reconstruction method performs on experimentally acquired data; and (3) the optimal imaging geometry. This will allow us to design a setting that can be used clinically for attenuation correction for emission tomography, various quantitative computed tomography (QCT) applications, and removal of metal streak artifacts.
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页码:1021 / 1022
页数:2
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