A mid-signal Built-In Self-Test approach for analog circuits

被引：0

作者：

Stroud, C ^{[1
]}

Morton, J ^{[1
]}

Islam, A ^{[1
]}

Alassaly, H ^{[1
]}

机构：

[1] Univ N Carolina, Dept Elect & Comp Engn, Charlotte, NC 28223 USA

来源：

2003 SOUTHWEST SYMPOSIUM ON MIXED-SIGNAL DESIGN | 2003年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A Built-In Self-Test (BIST) approach is described which is designed to test the analog portion of mixed-signal integrated circuits and systems. The BIST circuitry is located in the digital portion of the mixed-signal circuitry to minimize area overhead and effects on the analog portion of the mixed-signal system. The approach was evaluated using benchmark circuits for analog testing and found to consistently provide fault coverage greater than 95%, even when acceptable component parameter variations are added to the set of benchmark circuits.(1).

引用

页码：196 / 201

页数：6

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