A mid-signal Built-In Self-Test approach for analog circuits

被引：0
|
作者：
Stroud, C [1 ]
Morton, J [1 ]
Islam, A [1 ]
Alassaly, H [1 ]
机构：
[1] Univ N Carolina, Dept Elect & Comp Engn, Charlotte, NC 28223 USA
来源：
2003 SOUTHWEST SYMPOSIUM ON MIXED-SIGNAL DESIGN | 2003年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A Built-In Self-Test (BIST) approach is described which is designed to test the analog portion of mixed-signal integrated circuits and systems. The BIST circuitry is located in the digital portion of the mixed-signal circuitry to minimize area overhead and effects on the analog portion of the mixed-signal system. The approach was evaluated using benchmark circuits for analog testing and found to consistently provide fault coverage greater than 95%, even when acceptable component parameter variations are added to the set of benchmark circuits.(1).
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页码：196 / 201
页数：6
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