Power Management of Monolithic 3D Manycore Chips with Inter-tier Process Variations

被引:3
|
作者
Chatterjee, Anwesha [1 ]
Musavvir, Shouvik [1 ]
Kim, Ryan Gary [2 ]
Doppa, Janardhan Rao [1 ]
Pande, Partha Pratim [1 ]
机构
[1] Washington State Univ, 355 NE Spokane St, Pullman, WA 99163 USA
[2] Colorado State Univ, 1373 Campus Delivery, Ft Collins, CO 80524 USA
基金
美国国家科学基金会;
关键词
Monolithic; 3D; MIV; imitation learning; DVFI; inter-tier process variation; EDP; TECHNOLOGY; PERFORMANCE; INTEGRATION; NOC; ICS;
D O I
10.1145/3430765
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Voltage/frequency island (VFI)-based power management is a popular methodology for designing energy-efficient manycore architectures without incurring significant performance overhead. However, monolithic 3D (M3D) integration has emerged as an enabling technology to design high-performance and energy-efficient circuits and systems. The smaller dimension of vertical monolithic inter-tier vias (MIVs) lowers effective wirelength and allows high integration density. However, sequential fabrication of M3D layers introduces inter-tier process variations that affect the performance of transistors and interconnects in different layers. Therefore, VFI-based power management in M3D manycore systems requires the consideration of inter-tier process variation effects. In this work, we present the design of an imitation learning (IL)-enabled VFI-based power-management strategy that considers the inter-tier process-variation effects in M3D manycore chips. We demonstrate that the IL-based power-management strategy can be fine-tuned based on the M3D characteristics. Our policy generates suitable V/F levels based on the computation and communication characteristics of the system for both process-oblivious and process-aware configurations. We show that the proposed process-variation-aware IL-based VFI implementation for M3D manycore chips lowers the overall energy-delay-product (EDP) by up to 16.2% on average compared to an ideal M3D system with no M3D process variations.
引用
收藏
页数:19
相关论文
共 50 条
  • [41] An Inter-Layer Interconnect BIST Solution for Monolithic 3D ICs
    Koneru, Abhishek
    Chakrabarty, Krishnendu
    2018 IEEE 36TH VLSI TEST SYMPOSIUM (VTS 2018), 2018,
  • [42] Tier Partitioning Strategy to Mitigate BEOL Degradation and Cost Issues in Monolithic 3D ICs
    Samal, Sandeep Kumar
    Nayak, Deepak
    Ichihashi, Motoi
    Banna, Srinivasa
    Lim, Sung Kyu
    2016 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2016,
  • [43] Power-Delivery Network in 3D ICs: Monolithic 3D vs. Skybridge 3D CMOS
    Shi, Jiajun
    Li, Mingyu
    Moritz, Csaba Andras
    PROCEEDINGS OF THE IEEE/ACM INTERNATIONAL SYMPOSIUM ON NANOSCALE ARCHITECTURES (NANOARCH 2017), 2017, : 73 - 78
  • [44] Power Integrity Optimization of 3D Chips Stacked Through TSVs
    Ahmad, Waqar
    Zheng, Li-Rong
    Weeraseker, Roshan
    Chen, Qiang
    Weldezion, Awet Yemane
    Tenhunen, Hannu
    ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS, 2009, : 105 - 108
  • [45] Power consumption of 3D networks-on-chips: Modeling and optimization
    Elmiligi, Haytham
    El-Kharashi, M. Watheq
    Gebali, Fayez
    MICROPROCESSORS AND MICROSYSTEMS, 2013, 37 (6-7) : 530 - 543
  • [46] Scheduling Tests for 3D Stacked Chips under Power Constraints
    SenGupta, Breeta
    Ingelsson, Urban
    Larsson, Erik
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2012, 28 (01): : 121 - 135
  • [47] Non linear 3D electrothermal investigation on power MOS chips
    Chauffleur, X
    Tounsi, P
    Dorkel, JM
    Dupuy, P
    Fradin, JP
    PROCEEDING OF THE 2004 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 2004, : 156 - 159
  • [48] Scheduling Tests for 3D Stacked Chips under Power Constraints
    Breeta SenGupta
    Urban Ingelsson
    Erik Larsson
    Journal of Electronic Testing, 2012, 28 : 121 - 135
  • [49] Tier Degradation of Monolithic 3-D ICs: A Power Performance Study at Different Technology Nodes
    Panth, Shreepad
    Samal, Sandeep Kumar
    Samadi, Kambiz
    Du, Yang
    Lim, Sung Kyu
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2017, 36 (08) : 1265 - 1273
  • [50] THERMOELECTRIC COOLERS FOR HOTSPOT THERMAL MANAGEMENT OF 3D STACKED CHIPS
    Redmond, Matthew
    Manickaraj, Kavin
    Sullivan, Owen
    Kumar, Satish
    PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION, 2011, VOL 11, 2012, : 775 - 784