X-Ray Diffractometry Used for Determination of Autowave Velocity at Deformation

被引：0
|
作者：
Semukhin, Boris S. [1 ]
机构：
[1] Inst Strength Phys & Mat Sci SB RAS, Tomsk 634055, Russia
来源：
INTERNATIONAL CONFERENCE ON PHYSICAL MESOMECHANICS OF MULTILEVEL SYSTEMS 2014 | 2014年 / 1623卷
关键词：
localization of deformation; X-ray diffraction; autowave velocity; block structure; PLASTIC-DEFORMATION; SOLIDS; FLOW;
D O I：
10.1063/1.4899005
中图分类号：
O3 [力学];
学科分类号：
08 ; 0801 ;
摘要：
The paper presents the proprietary know-how of the autowave analysis which occur at deformation of solids. Traditional techniques of X-ray diffraction analysis are described to detect main autowave properties, i.e. wave propagation velocity and length.
引用
收藏
页码：555 / 558
页数：4
相关论文
共 50 条
  • [41] Accurate determination of SiO2-polymorphs in silica refractories by x-ray diffractometry
    Goswami, G
    Panda, JD
    Panigrahy, PK
    UNIFIED INTERNATIONAL TECHNICAL CONFERENCE ON REFRACTORIES (UNITECR 97), VOL 1 - 3: 5TH BIENNIAL WORLDWIDE CONGRESS - REFRACTORIES, A WORLDWIDE TECHNOLOGY, 1997, : 1549 - 1558
  • [42] Determination of inclusions in molten aluminum alloy by X-ray diffractometry after selective dissolution
    Iwatsuki, M
    Nishida, S
    Kitamura, T
    ANALYTICAL SCIENCES, 1998, 14 (03) : 617 - 619
  • [43] Determination of Inclusions in Molten Aluminum Alloy by X-Ray Diffractometry after Selective Dissolution
    Masaaki Iwatsuki
    Shintaro Nishida
    Teruo Kitamura
    Analytical Sciences, 1998, 14 : 617 - 619
  • [44] DETERMINATION OF STARCH GELATINIZATION BY X-RAY-DIFFRACTOMETRY
    OWUSUANSAH, J
    VANDEVOORT, FR
    STANLEY, DW
    CEREAL CHEMISTRY, 1982, 59 (03) : 167 - 171
  • [45] VACUUM FURNACE FOR HIGH TEMPERATURE X-RAY DIFFRACTOMETRY
    VANNIEKERK, JN
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (05): : 172 - 175
  • [46] Comparison of two standards for powder X-ray diffractometry
    Kojdecki, M. A.
    Mielcarek, W.
    Prociow, K.
    Warycha, J.
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2009, : 183 - 188
  • [47] TECHNIQUE FOR RIGID MOUNTING OF CRYSTALS IN X-RAY DIFFRACTOMETRY
    DENNE, WA
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (OCT1) : 400 - &
  • [48] Principles of X-ray diffractometry of surface acoustic waves
    Schelokov I.A.
    Schelokov, I. A. (igor@iptm.ru), 2013, Izdatel'stvo Nauka (07): : 1240 - 1253
  • [49] X-RAY TOPOGRAPHY AND PRECISION DIFFRACTOMETRY OF SEMICONDUCTING MATERIALS
    TANNER, BK
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) : C373 - C373
  • [50] Deconvolution of the instrumental functions in powder X-ray diffractometry
    Ida, T
    Toraya, H
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2002, 35 : 58 - 68
12345