X-Ray Diffractometry Used for Determination of Autowave Velocity at Deformation

被引：0
|
作者：
Semukhin, Boris S. [1 ]
机构：
[1] Inst Strength Phys & Mat Sci SB RAS, Tomsk 634055, Russia
来源：
INTERNATIONAL CONFERENCE ON PHYSICAL MESOMECHANICS OF MULTILEVEL SYSTEMS 2014 | 2014年 / 1623卷
关键词：
localization of deformation; X-ray diffraction; autowave velocity; block structure; PLASTIC-DEFORMATION; SOLIDS; FLOW;
D O I：
10.1063/1.4899005
中图分类号：
O3 [力学];
学科分类号：
08 ; 0801 ;
摘要：
The paper presents the proprietary know-how of the autowave analysis which occur at deformation of solids. Traditional techniques of X-ray diffraction analysis are described to detect main autowave properties, i.e. wave propagation velocity and length.
引用
收藏
页码：555 / 558
页数：4
相关论文
共 50 条
  • [1] Determination of the glassy fraction in slag cements by X-ray diffractometry
    Vaupel, H
    ZKG INTERNATIONAL, 2002, 55 (06): : 96 - 101
  • [2] Determination of mould powder crystallinity using X-ray diffractometry
    Riaz, S
    Mills, KC
    Nagata, K
    Ludlow, V
    Normanton, AS
    HIGH TEMPERATURE MATERIALS AND PROCESSES, 2003, 22 (5-6) : 379 - 386
  • [3] Determination of microconcentrations of amphibolic minerals in talc by the method of x-ray diffractometry
    Volkova, SA
    Krinari, GA
    Lygina, TZ
    Mikhailov, AA
    INDUSTRIAL LABORATORY, 2000, 66 (06): : 349 - 353
  • [4] FLUORESCENT SOURCES FOR X-RAY DIFFRACTOMETRY
    PARRISH, W
    LOWITZSCH, K
    SPIELBERG, N
    ACTA CRYSTALLOGRAPHICA, 1958, 11 (06): : 400 - 405
  • [5] X-ray diffractometry for the structure determination of a submicrometre single powder grain
    Yasuda, Nobuhiro
    Murayama, Haruno
    Fukuyama, Yoshimitsu
    Kim, Jungeun
    Kimura, Shigeru
    Toriumi, Koshiro
    Tanaka, Yoshihito
    Moritomo, Yutaka
    Kuroiwa, Yoshihiro
    Kato, Kenichi
    Tanaka, Hitoshi
    Takata, Masaki
    JOURNAL OF SYNCHROTRON RADIATION, 2009, 16 : 352 - 357
  • [6] SYNCHROTRON X-RAY POLYCRYSTALLINE DIFFRACTOMETRY
    PARRISH, W
    HART, M
    HUANG, TC
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 92 - 100
  • [7] X-ray diffractometry with a microfocus source
    Michaelsen, Carsten
    Wiesmann, Joerg
    Hasse, Bernd
    Preckwinkel, Uwe
    Cordes, Holger
    Yang, Ning
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C171 - C171
  • [8] Temperature resolved X-ray diffractometry
    Buchal, A
    APPLIED CRYSTALLOGRAPHY, 1998, : 278 - 282
  • [9] Introduction to X-ray Powder Diffractometry
    Jenkins, R.
    Snyder, R. L.
    Chemical Analysis, (138):
  • [10] X-Ray diffractometry of metamorphic nanoheterostructures
    Galiev, G. B.
    Pushkarev, S. S.
    Klimov, E. A.
    Maltsev, P. P.
    Imamov, R. M.
    Subbotin, I. A.
    CRYSTALLOGRAPHY REPORTS, 2014, 59 (02) : 258 - 265
12345