Probing quantum nanostructures with near-field optical microscopy and vice versa

被引：39
|
作者：
Bryant, GW [1 ]
机构：
[1] NIST, Gaithersburg, MD 20899 USA
来源：
APPLIED PHYSICS LETTERS | 1998年 / 72卷 / 07期
关键词：
D O I：
10.1063/1.120868
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A theory for using near-held optical microscopy to probe quantum nanostructures is presented. Optical transition rates are determined for dots excited by the near field of a tip. Local-held corrections are neglected. Results for different tip/dot configurations and sizes show that near-field excitation can enhance light-hole transitions, excite selection-rule breaking transitions with rates comparable to allowed transitions, and map electron-hole pair wave functions. Conversely, dot response can be used to characterize tip near fields.
引用
收藏
页码：768 / 770
页数：3
相关论文
共 50 条
  • [21] A near-field optical microscopy nanoarray
    Semin, DJ
    Ambrose, WP
    Goodwin, PM
    Wendt, JR
    Keller, RA
    MICROMACHINING AND IMAGING, 1997, 3009 : 109 - 118
  • [22] Near-field scanning - Optical microscopy
    Shiku, H
    Dunn, RC
    ANALYTICAL CHEMISTRY, 1999, 71 (01) : 23A - 29A
  • [23] Extinction near-field optical microscopy
    Hamann, HF
    Larbadi, M
    Barzen, S
    Brown, T
    Gallagher, A
    Nesbitt, DJ
    OPTICS COMMUNICATIONS, 2003, 227 (1-3) : 1 - 13
  • [24] SCANNING NEAR-FIELD OPTICAL MICROSCOPY
    HEINZELMANN, H
    POHL, DW
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02): : 89 - 101
  • [25] Optical Near-Field Electron Microscopy
    Marchand, Raphael
    Sachl, Radek
    Kalbac, Martin
    Hof, Martin
    Tromp, Rudolf
    Amaro, Mariana
    van der Molen, Sense J.
    Juffmann, Thomas
    PHYSICAL REVIEW APPLIED, 2021, 16 (01)
  • [26] Apertureless near-field optical microscopy
    Kazantsev, D. V.
    Kuznetsov, E. V.
    Timofeev, S. V.
    Shelaev, A. V.
    Kazantseva, E. A.
    PHYSICS-USPEKHI, 2017, 60 (03) : 259 - 275
  • [27] Near-field scanning optical microscopy
    Buratto, SK
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1996, 1 (04): : 485 - 492
  • [28] Artefacts in Near-Field Optical Microscopy
    Klapetek, Petr
    Bursik, Jiri
    PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2007, 61 : 570 - 575
  • [29] REFLECTION NEAR-FIELD OPTICAL MICROSCOPY
    SPAJER, M
    COURJON, D
    SARAYEDDINE, K
    JALOCHA, A
    VIGOUREUX, JM
    JOURNAL DE PHYSIQUE III, 1991, 1 (01): : 1 - 12
  • [30] RESOLUTION IN NEAR-FIELD OPTICAL MICROSCOPY
    ISAACSON, M
    CLINE, J
    BARSHATZKY, H
    ULTRAMICROSCOPY, 1992, 47 (1-3) : 15 - 22
12345