Apertureless near-field optical microscopy

被引:15
|
作者
Kazantsev, D. V. [1 ]
Kuznetsov, E. V. [2 ]
Timofeev, S. V. [2 ]
Shelaev, A. V. [2 ]
Kazantseva, E. A. [3 ]
机构
[1] Alikhanov Inst Theoret & Expt Phys, Natl Res Ctr, Kurchatov Inst, Ul B Cheremushkinskaya 25, Moscow 117218, Russia
[2] NT MDT Spectrum Instruments NT MDT, Proezd 4922,4-3, Moscow 124460, Russia
[3] Moscow Technol Univ, Prosp Vernadskogo 78, Moscow 119454, Russia
关键词
scanning near-field microscopy; Raman scattering; nanostructures; ASNOM; ENHANCED RAMAN-SPECTROSCOPY; SURFACE PHONON POLARITONS; ELECTRIC-FIELD; ABSORPTION-SPECTROSCOPY; PLASMONIC PHENOMENA; SINGLE-MOLECULE; PHASE-CONTRAST; SCATTERING; NANOPARTICLES; DIFFRACTION;
D O I
10.3367/UFNe.2016.05.037817
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
\ We discuss the operating principles of the apertureless scanning near-field optical microscope (ASNOM), in which the probe acts as a rod antenna and its electromagnetic radiation plays the role of the registered signal. The phase and amplitude of the emitted wave vary depending on the 'grounding conditions' of the antenna tip at the sample point under study. Weak radiation from a tiny (2-15 mu m long) tip is detected using optical homo- and heterodyning and the nonlinear dependence of the tip polarizability on the tip surface distance. The lateral resolution of ASNOMs is determined by the tip curvature radius (120 nm), regardless of the wavelength (500 nm-100 mu m). ASNOMs are shown to be capable of providing a surface optical map with nanometer resolution and carrying out spectral- and time-resolved measurements at a selected point on the surface.
引用
收藏
页码:259 / 275
页数:17
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