Simulation and Optimization of FILOX Vertical MOSFET for Subthreshold Leakage Reduction

被引:0
|
作者
Talal, Md Enamul Haque [1 ]
Ashburn, Peter [1 ]
机构
[1] Metropolitan Univ, Dept Elect & Elect Engn, Sylhet, Bangladesh
关键词
Vertical MOSFET; FILOX; Subthreshold leakage;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Subthreshold leakage current is becoming a significantly large component of total power dissipation for the state of the art CMOS technology nodes. As a result, devices need to be optimized for high performance and low power circuit operation. In this work we simulated an already fabricated FILOX vertical MOSFET reported by Hakim, et al [8]. Later this v-MOSFET was optimized using a low energy high-to-low step surface doping to raise MOSFET's threshold voltage. The use of this high threshold voltage v-MOSFET with a forward body bias applied during active mode in leakage current saving was examined. It was found that leakage current saving increases almost linearly with the increase in forward body bias. But as the forward body bias increases beyond 0.5v, a severe degradation of subthreshold slope was observed.
引用
收藏
页数:5
相关论文
共 50 条
  • [41] Simulation of vertical channel Nanoscale MOSFETs for low leakage DRAM cell
    Song, Seung-Hyun
    Lee, Jeong-Soo
    Jeong, Yoon-Ha
    IEEE NMDC 2006: IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE 2006, PROCEEDINGS, 2006, : 512 - +
  • [42] A calculation of leakage current by mathematical simulation in bipolar electrolyzer with vertical electrodes
    Bashkirskij Gosudarstvennyj Univ, Ufa, Russia
    Rasplavy, 1 (107-113):
  • [43] ONOFIC Pull-Up Approach in Domino Logic Circuits Using FinFET for Subthreshold Leakage Reduction
    Vijay Kumar Magraiya
    Tarun Kumar Gupta
    Circuits, Systems, and Signal Processing, 2019, 38 : 2564 - 2587
  • [44] Modeling of the gate leakage current reduction in MOSFET with ultra-thin nitrided gate oxide
    Yang, CW
    Fang, YK
    Ting, SF
    Chen, CH
    Wang, WD
    Lin, TY
    Wang, MF
    Yu, MC
    Chen, CL
    Yao, LG
    Chen, SC
    Yu, CH
    Liang, MS
    SOLID-STATE ELECTRONICS, 2003, 47 (04) : 751 - 754
  • [45] Physical Modeling of Bitcell Stability in Subthreshold SRAMs for Leakage-Area Optimization under PVT Variations
    Fan, Xin
    Wang, Rui
    Gemmeke, Tobias
    2018 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) DIGEST OF TECHNICAL PAPERS, 2018,
  • [46] Design optimization of stacked gate oxides with easy evaluation of gate leakage in deep submicron MOSFET
    Zhang, Jinlong
    Yuan, Jiann S.
    Ma, Yi
    Oates, Anthony S.
    Annual Device Research Conference Digest, 2000, : 69 - 70
  • [47] The Optimization Scheme Of The Leakage Current Reduction Technique For SRAM Design
    Shang Fengyi
    Peng Chunyu
    PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON CHEMICAL, MATERIAL AND FOOD ENGINEERING, 2015, 22 : 851 - 854
  • [48] On-chip decoupling capacitor optimization for noise and leakage reduction
    Chen, HH
    Neely, JS
    Wang, MF
    Co, G
    16TH SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN, SBCCI 2003, PROCEEDINGS, 2003, : 251 - 255
  • [49] Effect of the Ge-molefraction on the subthreshold slope and leakage current of vertical Si/Si1-xGex MOSFETs
    Collaert, N
    De Meyer, K
    SOLID-STATE ELECTRONICS, 1999, 43 (12) : 2173 - 2180
  • [50] Optimization of Static Power, Leakage Power and Delay of Full Adder Circuit Using Dual Threshold MOSFET Based Design and T-Spice Simulation
    Ghosh, Anindya
    Ghosh, Debapriyo
    2009 INTERNATIONAL CONFERENCE ON ADVANCES IN RECENT TECHNOLOGIES IN COMMUNICATION AND COMPUTING (ARTCOM 2009), 2009, : 903 - +