A single crystalline strontium titanate thin film transistor

被引:4
|
作者
Uchida, Kosuke [1 ]
Yoshikawa, Akira [1 ]
Koumoto, Kunihito [1 ]
Kato, Takeharu [2 ]
Ikuhara, Yuichi [2 ,3 ]
Ohta, Hiromichi [1 ,4 ]
机构
[1] Nagoya Univ, Grad Sch Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
[2] Japan Fine Ceram Ctr, Atsuta Ku, Nagoya, Aichi 4568587, Japan
[3] Univ Tokyo, Inst Engn Innovat, Bunkyo Ku, Tokyo 1138656, Japan
[4] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan
关键词
FIELD-EFFECT TRANSISTOR; GATE INSULATOR; MOBILITY; SRTIO3;
D O I
10.1063/1.3407568
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report herein fabrication and characterization of a thin film transistor (TFT) using single crystalline strontium titanate (SrTiO3) film, which was grown by a pulsed laser deposition technique followed by the thermal annealing treatment in an oxygen atmosphere. Although TFTs on the as-deposited SrTiO3 films (polycrystalline epitaxial films) exhibited poor transistor characteristics, the annealed single crystalline SrTiO3 TFT exhibits transistor characteristics comparable with those of bulk single crystal SrTiO3 field-effect transistor: an on/off current ratio >10(5), subthreshold swing similar to 2.1 V decade(-1), and field-effect mobility similar to 0.8 cm(2) V-1 s(-1). This demonstrates the effectiveness of the appropriate thermal annealing treatment of epitaxial SrTiO3 films. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3407568]
引用
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页数:3
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