Scanning probe microscopy .3. Studies of polymer surfaces with atomic force microscopy

被引：0
|
作者：
Magonov, SN
Heaton, MG
机构：
[1] UNIV FREIBURG, LAB SURFACE, FREIBURG, GERMANY
[2] UNIV FREIBURG, INTERFACES MAT RES CTR, FREIBURG, GERMANY
来源：
AMERICAN LABORATORY | 1996年 / 28卷 / 06期
关键词：
D O I：
暂无
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
This is the third article in a series covering aspects of scanning probe microscopy. This part focuses on applications of atomic force microscopy (AFM) in the study of polymer surfaces. AFM can reveal surface features such as morphology, nanostructure, chain packing, and conformation.
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页码：59 / +
页数：1
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