Scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy studies of selected videotapes

This study hopes to examine the various classification protocols as well as manufacturer brand videotapes, to delineate selected characteristic physical changes within the metallic oxide on the tapes at the nanometer regime to include the domain levels. Moreover, an examination of the tape magnetic domain boundaries and other particle characteristics from tape to tape and manufacturer to manufacturer will utilize the scanning tunneling microscope (STM), scanning electron microscope (SEM), and the atomic force microscope (AFM). This study examines these trails and characteristics by comparing and contrasting the results obtained from the STM, the AFM and the SEM for nonrecorded tapes.