SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY FOR MICROTRIBOLOGY

被引：68

|

作者：

KANEKO, R

NONAKA, K

YASUDA, K

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575428

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：291 / 292

页数：2

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