Atomic force microscopy and scanning tunneling microscopy of rubbed polyimide surfaces.

被引：0
|
作者：
Devlin, C [1 ]
Chiang, S [1 ]
机构：
[1] UNIV CALIF DAVIS,DEPT PHYS,DAVIS,CA 95616
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1997年 / 213卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：387 / POLY
页数：2
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