Metrology in scanning probe microscopy with atomic force microscopy and near-field scanning optical microscopy

被引：0
|
作者：
zurMuhlen, E [1 ]
Munoz, M [1 ]
Gehring, S [1 ]
Reineke, F [1 ]
机构：
[1] TOPOMETRIX GMBH,D-64293 DARMSTADT,GERMANY
来源：
EUROPEAN JOURNAL OF CELL BIOLOGY | 1997年 / 74卷
关键词：
D O I：
暂无
中图分类号：
Q2 [细胞生物学];
学科分类号：
071009 ; 090102 ;
摘要：
引用
收藏
页码：72 / 72
页数：1
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