Metrology in scanning probe microscopy with atomic force microscopy and near-field scanning optical microscopy

被引：0
|
作者：
zurMuhlen, E [1 ]
Munoz, M [1 ]
Gehring, S [1 ]
Reineke, F [1 ]
机构：
[1] TOPOMETRIX GMBH,D-64293 DARMSTADT,GERMANY
来源：
EUROPEAN JOURNAL OF CELL BIOLOGY | 1997年 / 74卷
关键词：
D O I：
暂无
中图分类号：
Q2 [细胞生物学];
学科分类号：
071009 ; 090102 ;
摘要：
引用
收藏
页码：72 / 72
页数：1
相关论文
共 50 条
  • [41] Near-field scanning optical microscopy of nanostructures
    DeAro, JA
    Weston, KD
    Buratto, SK
    [J]. PHASE TRANSITIONS, 1999, 68 (01) : 27 - 57
  • [42] Differential near-field scanning optical microscopy
    Ozcan, Aydogan
    Cubukcu, Ertugrul
    Bilenca, Alberto
    Crozier, Kenneth B.
    Bouma, Brett E.
    Capasso, Federico
    Tearney, Guillermo J.
    [J]. NANO LETTERS, 2006, 6 (11) : 2609 - 2616
  • [43] Applications of near-field scanning optical microscopy
    Hess, HF
    Betzig, E
    [J]. SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 395 - 398
  • [44] SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)
    POHL, DW
    FISCHER, UC
    DURIG, UT
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 853 - 861
  • [45] NEAR-FIELD OPTICAL-SCANNING MICROSCOPY
    DURIG, U
    POHL, DW
    ROHNER, F
    [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (10) : 3318 - 3327
  • [46] Contact scanning near-field optical microscopy
    D. A. Lapshin
    S. K. Sekatskii
    V. S. Letokhov
    V. N. Reshetov
    [J]. Journal of Experimental and Theoretical Physics Letters, 1998, 67 : 263 - 268
  • [47] Scanning near-field optical microscopy (SNOM)
    Cricenti, A.
    [J]. PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 8, 2008, : 2615 - 2620
  • [48] Near-field scanning optical microscopy nanoprobes
    Fleischer, Monika
    [J]. NANOTECHNOLOGY REVIEWS, 2012, 1 (04) : 313 - 338
  • [49] DETECTION OF PROBE DITHER MOTION IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    FROEHLICH, FF
    MILSTER, TD
    [J]. APPLIED OPTICS, 1995, 34 (31): : 7273 - 7279
  • [50] Instrumentation for dual-probe scanning near-field optical microscopy
    Kaneta, A.
    Fujimoto, R.
    Hashimoto, T.
    Nishimura, K.
    Funato, M.
    Kawakami, Y.
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (08):
12345