An Improved Macro-Model for Simulation of Single Electron Transistor (SET) Using HSPICE

被引:6
|
作者
Karimian, M. [1 ]
Dousti, M. [1 ]
Pouyan, M. [2 ]
Faez, R. [3 ]
机构
[1] Islamic Azad Univ, Dept Elect Engn, Sci & Res Branch, Tehran, Iran
[2] Shahed Univ, Fac Engn, Tehran, Iran
[3] Sharif Univ Technol, Fac Engn, Tehran, Iran
关键词
Single electron transistor (SET); Macro-model; HSPICE; SIMON; Switched capacitor circuit; Quantizer; COMPACT SIMULATION; DESIGN; MODEL; CIRCUITS; DEVICES;
D O I
10.1109/TIC-STH.2009.5444535
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
To get a more accurate model for simulation of single electron transistors (SETs), we have proposed a new macro-model that includes the ability of electron tunneling time calculation. In our proposed model, we have modified the previous models and applied some basic corrections to their formulas. In addition, we have added a switched capacitor circuit, as a quantizer, to calculate the electron tunneling time. We used HSPICE for high-speed simulation and observed that the simulation results obtained from our model matched more closely with that of SIMON 2.0. We also could evaluate the time of electron tunneling through the barrier by using the quantizer. Clearly, our macro-model gives more accurate results than of the other models when compare with SIMON 2.0, and can be used for calculating the delay time of complicated circuits.
引用
收藏
页码:1000 / 1004
页数:5
相关论文
共 50 条
  • [31] Improved Small-Signal Model of Single-Electron Transistor
    Ghosh, Arpita
    Sarkar, Subir Kumar
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2018, 17 (06) : 1244 - 1251
  • [32] A computationally efficient model of single electron transistor for analog IC simulation
    Radwan, Mohammed S.
    Marzouk, El-Said A.
    Rehan, Sameh E.
    Abdel-Fattah, Abdel-Fattah I.
    MICROELECTRONICS JOURNAL, 2015, 46 (04) : 301 - 309
  • [33] Estimation of inside stress of microcantilever - (Investigation of measuring principle using macro-model)
    Arai, Y
    Yokozeki, S
    LASER INTERFEROMETRY X: TECHNIQUES AND ANALYSIS AND APPLICATIONS, PTS A AND B, 2000, 4101 : 132 - 139
  • [34] Design and Testing of Digital Logic Gates Using HCS Macro-Model
    Kolay, Snigdha Chowdhury
    Bandyopadhyay, Mandakinee
    Chattopadhyay, Subrata
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2023, 70 (03) : 1134 - 1138
  • [35] Flash memory-cell characterization using two-transistor cell compact macro-model for system-on-chip design
    Chen, CY
    Saha, S
    DATA ANALYSIS AND MODELING FOR PROCESS CONTROL II, 2005, 5755 : 79 - 86
  • [36] Development of a Behavioral Model of the Single-Electron Transistor for Hybrid Circuit Simulation
    Castro-Gonzalez, Francisco
    Sarmiento-Reyes, Arturo
    2014 INTERNATIONAL CARIBBEAN CONFERENCE ON DEVICES, CIRCUITS AND SYSTEMS (ICCDCS), 2014,
  • [37] SET-based nano-circuit simulation and design method using HSPICE
    Zhang, FM
    Tang, R
    Kim, YB
    MICROELECTRONICS JOURNAL, 2005, 36 (08) : 741 - 748
  • [38] Current dynamics-based macro-model for power simulation in a complex VLIW DSP processor
    Muresan, R
    Gebotys, C
    IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES, 2002, 149 (04): : 173 - 187
  • [39] Improved analysis of the single-electron transistor mixer
    Abuelma'atti, Muhammad Taher
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2009, 61 (03) : 223 - 229
  • [40] Improved analysis of the single-electron transistor mixer
    Muhammad Taher Abuelma’atti
    Analog Integrated Circuits and Signal Processing, 2009, 61 : 223 - 229