Design for testability and built-in self-test of integrated circuits and systems: How these can add value to your products

被引：0
|
作者：
Ivanov, A [1 ]
机构：
[1] UNIV BRITISH COLUMBIA,DEPT ELECT ENGN,VANCOUVER,BC V6T 1Z4,CANADA
来源：
38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2 | 1996年
关键词：
testing; design for testability (DfT); scan design; built-in self-test (BIST);
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：712 / 717
页数：6
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