Stochastic Resonance in Bang-Bang Phase Detector Gain and the Impact on CDR Locking

被引：0
|
作者：
Ardila, Javier [1 ]
Roa, Elkim [1 ]
机构：
[1] Univ Ind Santander, Integrated Syst Res Grp OnChip, Bucaramanga, Colombia
来源：
2018 IEEE 9TH LATIN AMERICAN SYMPOSIUM ON CIRCUITS & SYSTEMS (LASCAS) | 2018年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, a phenomenon called stochastic resonance (SR) is modeled and validated for clock and data recovery (CDR) circuits. In order to explain the underlying of the phenomenon in these systems, uniform and sinusoidal jitter noise are faced. The impact of SR on jitter transfer function (JTF) and jitter tolerance function (JTOL) is also presented and discussed for the USB 3.1 Gen1 standard.
引用
收藏
页码：306 / 309
页数：4
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